Exclusive

Publication

Byline

Location

US Patent Issued to Huawei Digital Power Technologies on April 7 for "Circuit breaker and power supply system" (Chinese, German Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,579, issued on April 7, was assigned to Huawei Digital Power Technologies Co. Ltd. (Shenzhen, China). "Circuit breaker and power supply sys... Read More


US Patent Issued to Siemens Healthineers on April 7 for "X-ray generating apparatus and imaging device" (Chinese Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,580, issued on April 7, was assigned to Siemens Healthineers AG (Forchheim, Germany). "X-ray generating apparatus and imaging device" was i... Read More


US Patent Issued to HAMAMATSU PHOTONICS on April 7 for "X-ray generation device" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,581, issued on April 7, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "X-ray generation device" was invented by Naonobu Suzu... Read More


US Patent Issued to JEOL on April 7 for "Charged particle beam apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,582, issued on April 7, was assigned to JEOL Ltd. (Tokyo). "Charged particle beam apparatus" was invented by Kenichi Tsutsumi (Tokyo), Tats... Read More


US Patent Issued to FEI on April 7 for "FIB and SEM resolution enhancement using asymmetric probe deconvolution" (Dutch, American Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,583, issued on April 7, was assigned to FEI Co. (Hillsboro, Ore.). "FIB and SEM resolution enhancement using asymmetric probe deconvolution... Read More


US Patent Issued to HITACHI HIGH-TECH on April 7 for "Charged particle beam apparatus and processor system" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,584, issued on April 7, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Charged particle beam apparatus and processor system" was invente... Read More


US Patent Issued to NATIONAL TAIPEI UNIVERSITY on April 7 for "Shape-based proximity effect correction method for throughput, patterning fidelity, and contrast enhancement of particle beam lithography and imaging structure" (Taiwanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,585, issued on April 7, was assigned to NATIONAL TAIPEI UNIVERSITY (New Taipei City, Taiwan). "Shape-based proximity effect correction meth... Read More


US Patent Issued to Tokyo Electron on April 7 for "Plasma processing apparatus and matching method" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,586, issued on April 7, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing apparatus and matching method" was invented by Sho ... Read More


US Patent Issued to Applied Materials on April 7 for "Process chambers having multiple cooling plates" (American, Indian Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,587, issued on April 7, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Process chambers having multiple cooling plates" was... Read More


US Patent Issued to Applied Materials on April 7 for "Inductively coupled plasma apparatus with novel faraday shield" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,588, issued on April 7, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Inductively coupled plasma apparatus with novel fara... Read More